3M Cleaning Film T-XX, Disc is used in semiconductor manufacturing fab. Probe card is an important part for testing availability of semiconductor chips formed on silicon wafer , and then chips are determined if no problem. High reliablity of probe card is critical for chip production yield, so the probe card must be cleaned by 3M Cleaning Film T-XX, laminated on dummy wafer. 3M Cleaning Film T-XX, can be easily used with specific size of dummy wafer.
For more information about Cleaning Film T-C2L, visit the official 3M website.
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| Pieces Per Case | 10 |
|---|---|
| Unit of Measure | Case |
| Product Id | 7010602022 |
| Part Number | 3MABR-7010602022 |
| UPC | 04549395362974 |
| Per Case | 10 |
| Weight | 0.486 lbs |
| Make to Order | Yes |
| Brand | 3M™ |
| Diameter | 50 mm, 6.328 in |
| Abrasive Material | Aluminum Oxide |
| Attachment Type | PSA |
| Micron Grade | 3 μm |
| Product Form | Disc |
| Dimensions | 8.7 × 14.2 × 2.4 in |
